AZoM on MSN

Imaging silicon defects using Raman and PL multivariate imaging

PCA and K-means clustering applied to Raman and PL imaging reveal structural defects in silicon wafers, enhancing understanding of optoelectronic performance.
IEEE

Numerical Efficient Probabilistic Three-Phase Load Flow Based on GALHS With WGs Uncertainties Including VDL Loads and Correlation

Abstract: The shift to a horizontally integrated from a vertically integrated structure in the power system leads to heightened uncertainty across multiple levels. The incorporation of uncertain ...
IEEE

Timing Offset Estimation in OTFS Systems Using Zero-Correlation-Zone Sequences

Abstract: In this paper, a novel timing-offset (TO) estimation method is proposed for orthogonal time-frequency-space (OTFS) systems using zero-correlation-zone (ZCZ) sequences. In contrast to prior ...