When contamination defects surface in advanced nodes, the root cause often spans tools, materials, and handling. This piece outlines how defect mapping, TEM, and SPC data converge to prove causation.

Not all defects are visible with the same microscope. Explore how resolution, contrast, and signal interpretation shape ...

Scientists at the Department of Energy's Lawrence Berkeley National Laboratory (Berkeley Lab) have developed a new way to determine atomic structures from nanocrystals previously considered unusable, ...

Lawrence Livermore National Laboratory's National Ignition Facility (NIF) is the hottest place on Earth for the briefest of moments during an experiment. Now, it can be one of the brightest places ...

Researchers at Cornell University have developed a powerful imaging technique that reveals atomic scale defects inside computer chips for the first time. Using an advanced electron microscopy method, ...

X-ray crystallography is a technique that uses X-ray diffraction patterns to determine high-resolution, three-dimensional structures of molecules such as proteins, small organic molecules, and ...

A stunning new imaging breakthrough lets scientists see — and fix — the atomic flaws hiding inside tomorrow’s computer chips.

Vibrational microscopy methods offer bond-selective imaging, revealing the rich chemical composition of biological samples. In this Focus issue, we celebrate the past, present and future of these ...

The semiconductor industry is evolving with quantum imaging and AI-driven technologies, enhancing defect detection and ...