Exploded view of a typical benchtop memory tester. Many manufacturers of aerospace products turn to SDRAM and DDR technologies to provide the computational power their systems require. Even though ...
The variety of different test methodologies combined with today�s mixture of memory devices creates a complex test profile. The manufacturing test floor hums with activity; a range of memory devices ...
TOKYO—Semiconductor test equipment supplier Advantest Corporation has announced its next-generation B6700D memory burn-in tester to meet growing global customer demand for server and mobile ...
The rapid evolution of semiconductor devices has amplified the demand for advanced automated test equipment (ATE) that can handle increasingly complex test scenarios for logic devices. ATE vector ...
NORTH READING, Mass.--(BUSINESS WIRE)--Teradyne, Inc. (NASDAQ: TER), a leading provider of automated test equipment and advanced robotics, is proud to announce the launch of the Magnum 7H, a ...
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