Design-Reuse

Genesys Testware adds efficient automated insertion of embedded test and repair circuits for memory

Fremont, California, June 3, 2005 — Genesys Testware, Inc., a leading supplier of yield, quality and cost optimization tools for nanometer ICs, announced today the addition of efficient automated ...
Design-Reuse

Genesys Testware develops design and test flow for increasing IC yield using Artisan Flex-Repair memories with ArraytestMaker repair

FREMONT, California, October 9, 2003—Genesys Testware, Inc., a leading supplier of embedded test, diagnosis and repair solutions announced today that it has developed a design and test flow for ...