Processing diamond surfaces with femtosecond lasers yields a trade-off between hydrophilicity and low defect rate.

Researchers have designed a robust image-based anomaly detection (AD) framework with illumination enhancement and noise suppression features that can enhance the detection of subtle defects in ...

A new theoretical study led by researchers at the University of Chicago and Argonne National Laboratory has identified the microscopic mechanisms by which diamond surfaces affect the quantum coherence ...

Insights into surface spin interactions with NV centers in diamond offer strategies to combat decoherence, crucial for advancing quantum sensing capabilities.

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Figure 1. Ultrasonic testing using pulse echo and through-transmission methods. Pulse echo (left and center) uses a transducer that sends and receives ultrasound energy, producing both A- and B-scan ...

Reducing defects on the wafer edge, bevel, and backside is becoming essential as the complexity of developing leading-edge chips continue to increase, and where a single flaw can have costly ...

Defect states refer to electronic energy levels that arise from imperfections or irregularities in the crystal structure of materials, particularly in semiconductors and insulators. These ...