X-ray microanalysis is an analytical technique that provides immense possibilities to extend beyond high resolution mapping of elements. Speed and precision are the real powers of X-ray microanalysis, ...

X-ray microanalysis is a powerful tool with high precision and speed, often revealing unexpected chemical phases, which cannot be detected by element-based image analysis alone as there are ...

Electron microscopy combined with X-ray microanalysis represents a pivotal suite of techniques that have transformed research in materials science, physics and engineering. Utilizing focused beams of ...

Christopher J. Kiely, the Harold B. Chambers Senior Professor of Materials Science and Engineering at Lehigh University’s P.C. Rossin College of Engineering and Applied Science, has been elected as a ...

Lehigh University materials science and engineering (MSE) professor Masashi Watanabe is the 2023 recipient of the Microanalysis Society Presidential Science Award, which recognizes a senior scientist ...

At the Microscopy & Microanalysis 2008 Annual Meeting opening, Bruker AXS Microanalysis has introduced several new products and options for Scanning Electron Microscope (SEM) based materials analysis.

On April 11th JoVE (Journal of Visualized Experiments) will publish a new video article by Dr. Aydogan Ozcan demonstrating how a cell phone camera can capture images from a fluorescent microscope and ...

The Hitachi S-4700 FE-SEM is a cold field emission high resolution scanning electron microscope. This SEM permits ultra high resolution imaging of thin films and semi-conductor materials on ...

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Enhancements to the Noran System Six, Thermo Electron's X-ray microanalysis system, enable productivity gains in high-throughput microstructure characterization. Combined with a newly introduced 30-mm ...

The Nature Index tracks primary research articles from 145 natural-science and health-science journals, chosen based on reputation by an independent group of researchers. The Nature Index provides ...

Transmission Electron Microscope: FEI Talos F200s Scanning Transmission Electron Microscope (S/TEM) equipped with SuperX-EDS detector FEI Single Tilt Holder FEI Double Tilt Holder FEI Double Tilt ...