Interference microscopy is an optical microscopy technique that uses interference between two white-light illumination beams or rays to generate an image with enhanced contrast. A transmissive Fourier ...

Automated DIC imaging with the DM6 M microscope enhances six-inch wafer inspection, providing reproducible results and improved efficiency for defect analysis.

Receive emails about upcoming NOVA programs and related content, as well as featured reporting about current events through a science lens. The new microscope uses a 405 nm laser—the same wavelength ...