Chipmakers are pushing into sub-threshold operation in an effort to prolong battery life and reduce energy costs, adding a whole new set of challenges for design teams. While process and environmental ...
Complex issues stemming from near-threshold computing, where the operating voltage and threshold voltage are very close together, are becoming more common at each new node. In fact, there are reports ...
High yield achieved for the world's smallest level 6-transistor SRAM memory-cell area (0.494µm 2) ; stabilization technique addresses variability of transistor characteristics. Tokyo, June 15, 2006 −− ...
Advanced process technologies, such as 90nm, 65nm, 45nm and below, present significant power management challenges for high performance semiconductors. Chip designers face increasing challenges in ...
At nanometer technologies, variability is rapidly becoming one of the leading causes for chip failures and delayed schedules. However, there is significant confusion about the term “variability” in ...
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