Production test of a finished electronic product often involves two techniques: in-circuit test (ICT) and functional component test (FCT). The ICT technique examines a non-powered circuit board to ...

Multi-die assemblies greatly increase the number of things that can go wrong, and the difficulty of finding them.

The approach to high-end aerospace/defense test system development is shifting from application-specific systems to common core automated systems to reduce overall cost and increase flexibility.

SE: Why is applying functional test content so challenging today? Ruiz: There are a couple of different factors that make successfully applying functional patterns on the tester a challenge. In fact, ...