Researchers have designed a robust image-based anomaly detection (AD) framework with illumination enhancement and noise suppression features that can enhance the detection of subtle defects in ...
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AI model accelerates defect-based material design
Across the physical world, many intricate structures form via symmetry breaking. When a system with inherent symmetry transitions into an ordered state, it can form stable imperfections known as ...
What if manufacturing companies could pinpoint the exact cause of a defect the moment it occurs, preventing costly production delays and ensuring top-notch quality? Generative artificial intelligence ...
On the technology spectrum, railroads would certainly seem to skew toward the brutally simplistic side of things. A couple of strips of steel, some wooden ties and gravel ballast to keep everything in ...
Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...
Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...
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