A new technical paper titled “DECOR: Deep Embedding Clustering with Orientation Robustness” was published by researchers at Oregon State University and Micron Technology. “In semiconductor ...
Emergence of anti-hyperuniform defect organization in active nematics. At high activity (left), topological defects are distributed nearly uniformly throughout the system. Reducing activity toward a ...
The principle of Bug Clustering states that the majority of defects are often concentrated in a small number of modules or components of a software system. It can be seen as an application of the ...
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