Complex interrelated phenomena lead to battery failure, which is dependent on battery design, environment, chemistry, and true operation conditions. Therefore, studies at the component level are ...

Graphene is a zero bandgap semiconductor with high electrical conductivity, making it a potential candidate for advancing the semiconductor industry. It is a highly robust material, with a tensile ...

Scanning Capacitance Microscopy (SCM) and Scanning Spreading Resistance Microscopy (SSRM) are both well-established scanning probe-based techniques for two-dimensional carrier profiling. Driven by the ...

Atomic Force Microscopy (AFM) is an advanced material imaging technique, which is able to provide accurate topographic images of a surface. It was created by Gerd Binning and Heinrich Rohrer in 1986 ...